Transmission Electron Microscopy and Diffractometry of Materials
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Belk, J. Electron microscopy and microanalysis of crystalline materials.
Transmission electron microscopy
London : Applied Science Publishers, De Graef, Marc. Introduction to conventional transmission electron microscopy.
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Cambridge : Cambridge University Press, Eberhart, J. Structural and chemical analysis of materials: x-ray, electron and neutron diffraction; X-ray, electron and ion spectrometry; electron microscopy.
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New York : Wiley, Egerton, R. Electron energy-loss spectroscopy in the electron microscope 2nd ed. New york : Plenum Press, Fultz, B. Transmission electron microscopy and diffractometry of materials.
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New York : Springer, Goldstein, J. Scanning electron microscopy and x-ray microanalysis 3rd ed. Spara som favorit. Skickas inom vardagar. Skickas inom vardagar specialorder.
This book explains concepts of transmission electron microscopy TEM and x-ray diffractometry XRD that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity.
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The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. A SEM uses the electrons that are scattered off of the sample surface to produce images of the sample.
In a TEM, the electron beam passes through the sample and produces an image using the transmitted electron beam; which contains both diffracted and unscattered electrons.
Detectors in both SEM and TEM instruments collect the characteristic x-rays that are generated from the sample to allow for compositional analysis of the material. This type of x-ray production in the sample is the same principle as that of the generation of x-rays used in x-ray diffraction instruments.
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Limitation of TEM: Sample size and preparation. The material must be less than nm thick in order to pass the electron beam through. So you are only observing a very small portion of the material.
Whereas in XRD, it can very difficult to produce diffraction from a perfect single crystal. Electron diffraction is very sensitive to changes in the crystal structure, such as small degrees of short range ordering in the material that cannot be detectable through XRD.
Electron diffraction, however, is used to investigate very small regions in the sample and does not provide an overall "view" of the material as in XRD. Produced from diffraction of the electron beam off of planes in the sample. The pattern is a scaled representation of a section of the reciprocal lattice. Each spot represents a plane in the crystal that has diffracted.
The diffraction patterns are typically taken when the sample is tilted so that the electron beam is passing down a particular crystallographic zone direction in the crystal , with each diffracted spot in the pattern representing a plane which passes through that zone.